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SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port

SCANPSC110F SCAN Bridge October 1999 SCANPSC110F SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) General Description The SCANPSC110F Bridge extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a hierarchical approach over a single serial scan chain is improved test throughput and the ability to remove a board from the system and retain test access to the remaining modules. Each SCANPSC110F Bridge supports up
National Semiconductor
National Semiconductor

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